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[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Expert system algorithms for identifying radiated emission problems in printed circuit boards
Shim, H., Hubing, T., Van Doren, T., DuBroff, R., Drewniak, J., Pommerenke, D., Kaires, R.Volume:
1
Year:
2004
Language:
english
DOI:
10.1109/isemc.2004.1349996
File:
PDF, 470 KB
english, 2004