[IEEE 2015 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) - Kuala Terengganu, Malaysia (2015.8.19-2015.8.21)] 2015 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) - Impact of silicon-body thickness on emulation of double-gate UTBB SOI MOSFETs with different ground plane structures

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