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[IEEE 2015 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) - Kuala Terengganu, Malaysia (2015.8.19-2015.8.21)] 2015 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) - Impact of silicon-body thickness on emulation of double-gate UTBB SOI MOSFETs with different ground plane structures
Othman, Noraini, Arshad, M. K. Md, Sabki, S. N., Hashim, U.Year:
2015
Language:
english
DOI:
10.1109/rsm.2015.7354985
File:
PDF, 268 KB
english, 2015