[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - Parity-based concurrent error detection in symmetric block ciphers
Karri, R., Kuznetsov, G., Goessel, M.Volume:
1
Year:
2003
Language:
english
DOI:
10.1109/test.2003.1271078
File:
PDF, 753 KB
english, 2003