[IEEE 2011 IEEE International 3D Systems Integration Conference (3DIC) - Osaka (2012.01.31-2012.02.2)] 2011 IEEE International 3D Systems Integration Conference (3DIC), 2011 IEEE International - Effect of planarity on the 3D integration in 3-D integrated CMOS image sensor
Kwon, Nam Hee, Hong, S. M., Cha, Yong-Won, Lee, Sun Jae, Lee, Han Gyul, Kim, Areum, Kim, Soo Won, Kim, Chang Hyun, Pyo, Sung GyuYear:
2012
DOI:
10.1109/3dic.2012.6263018
File:
PDF, 123 KB
2012