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[IEEE 2015 IEEE/ACM 10th International Workshop on Automation of Software Test (AST) - Florence, Italy (2015.5.23-2015.5.24)] 2015 IEEE/ACM 10th International Workshop on Automation of Software Test - Combining Unit Tests for Data Race Detection
Schimmel, Jochen, Molitorisz, Korbinian, Jannesari, Ali, Tichy, Walter F.Year:
2015
Language:
english
DOI:
10.1109/ast.2015.16
File:
PDF, 315 KB
english, 2015