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[IEEE Comput. Soc Design, Automation and Test in Europe Conference and Exhibition - Paris, France (16-20 Feb. 2004)] Proceedings Design, Automation and Test in Europe Conference and Exhibition - Hybrid delay scan: a low hardware overhead scan-based delay test technique for high fault coverage and compact test sets
Seongmoon Wang,, Xiao Liu,, Chakradhar, S.T.Year:
2004
Language:
english
DOI:
10.1109/date.2004.1269074
File:
PDF, 294 KB
english, 2004