[IEEE 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Amherst, MA, USA (2015.10.12-2015.10.14)] 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Influence of triple-well technology on laser fault injection and laser sensor efficiency
Borrel, N., Champeix, C., Kussener, E., Rahajandraibe, W., Lisart, M., Sarafianos, A., Dutertre, J-M.Year:
2015
Language:
english
DOI:
10.1109/dft.2015.7315141
File:
PDF, 9.63 MB
english, 2015