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[IEEE 2000 22nd International Conference on Microelectronics. Proceedings - Nis, Yugoslavia (14-17 May 2000)] 2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) - Characterization of epitaxial Hg/sub 1-x/Cd/sub x/Te layers using the far infrared optical method
Nikolic, P.M., Dinovic, Z., Radulovic, K., Vasiljevic-Radovic, D., Duric, S., Mihajlovic, P., Siapkas, D.I., Zorba, T.T.Volume:
1
Year:
1999
Language:
english
DOI:
10.1109/icmel.2000.840572
File:
PDF, 283 KB
english, 1999