[IEEE Comput. Soc 15th International Conference on Pattern...

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[IEEE Comput. Soc 15th International Conference on Pattern Recognition - Barcelona, Spain (3-7 Sept 2000)] Proceedings 15th International Conference on Pattern Recognition. ICPR-2000 - Bias of error rates in linear discriminant analysis caused by feature selection and sample size

Schulerud, H.
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Volume:
2
Year:
2000
Language:
english
DOI:
10.1109/icpr.2000.906090
File:
PDF, 557 KB
english, 2000
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