[IEEE IECON'01. 27th Annual Conference of the IEEE...

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[IEEE IECON'01. 27th Annual Conference of the IEEE Industrial Electronics Society - Denver, CO, USA (29 Nov.-2 Dec. 2001)] IECON'01. 27th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.37243) - A novel robust fault identification approach for a class of discrete systems

Yudong Chen,, Songjiao Shi,, Zhengxin Weng,
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Volume:
1
Year:
2001
Language:
english
DOI:
10.1109/iecon.2001.976700
File:
PDF, 256 KB
english, 2001
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