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[IEEE 2006 International Conference of the IEEE Engineering in Medicine and Biology Society - New York, NY, USA (2006.08.30-2006.09.3)] 2006 International Conference of the IEEE Engineering in Medicine and Biology Society - Effect of Source Depth on the Specificity of Bipolar EEG Measurements

Ryynanen, Outi, Vaisanen, Juho, Hyttinen, Jari, Malmivuo, Jaakko
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Year:
2006
Language:
english
DOI:
10.1109/iembs.2006.260340
File:
PDF, 520 KB
english, 2006
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