[IEEE 2010 Second IITA International Conference on...

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[IEEE 2010 Second IITA International Conference on Geoscience and Remote Sensing (IITA-GRS 2010) - Qingdao, China (2010.08.28-2010.08.31)] 2010 Second IITA International Conference on Geoscience and Remote Sensing - Design and development of scales and slope scales meeting national specifications based on ArcGIS platform

Lv, Yan-li, Wang, Rui-fu, Zhao, Shao-jie, Wang, Xin, Yang, Cai-hong
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Year:
2010
Language:
english
DOI:
10.1109/iita-grs.2010.5602689
File:
PDF, 626 KB
english, 2010
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