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[IEEE IEEE MTT-S International Microwave Symposium - IMS 2003 - Philadelphia, PA, USA (8-13 June 2003)] IEEE MTT-S International Microwave Symposium Digest, 2003 - Combined analysis of systematic and random uncertainties for different noise-figure characterization methodologies
Collado, A., Collantes, J.M., De la Fuente, L., Otegi, N., Perea, L., Sayed, M.Year:
2003
Language:
english
DOI:
10.1109/mwsym.2003.1212638
File:
PDF, 280 KB
english, 2003