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[IEEE 2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Boston, MA, USA (2015.10.26-2015.10.28)] 2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Prediction of the degradation of a hetero-junction bipolar transistor accompanied with aging simulation
Kim, Jonggook, Tang, Jin, Dahlstrom, Mattias, Green, KeithYear:
2015
Language:
english
DOI:
10.1109/bctm.2015.7340567
File:
PDF, 614 KB
english, 2015