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[IEEE 2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP) - Ann Arbor, MI, USA (2015.10.18-2015.10.21)] 2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Development of a surface charge measurement system for GIS insulator in SF6
Chunjia Gao,, Bo Qi,, Zhaoliang Xing,, Chengrong Li,, Linjie Zhao,, Xiaqing Sun,Year:
2015
Language:
english
DOI:
10.1109/ceidp.2015.7352095
File:
PDF, 729 KB
english, 2015