[IEEE 2014 IEEE 17th International Conference on...

  • Main
  • [IEEE 2014 IEEE 17th International...

[IEEE 2014 IEEE 17th International Conference on Computational Science and Engineering (CSE) - Chengdu, China (2014.12.19-2014.12.21)] 2014 IEEE 17th International Conference on Computational Science and Engineering - Study on the Effect Mechanism of the Bipolar Junction Transistor Caused by ESD

Tan, Zhiliang, Song, Peijiao, Ma, Liyun, Meng, Zhaoxiang
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2014
Language:
english
DOI:
10.1109/cse.2014.86
File:
PDF, 618 KB
english, 2014
Conversion to is in progress
Conversion to is failed