[IEEE 2005 42nd Design Automation Conference - Anaheim, CA, USA (2005.06.13-2005.06.17)] Proceedings. 42nd Design Automation Conference, 2005. - A design platform for 90-nm leakage reduction techniques
Royannez, P., Mair, H., Dahan, F., Wagner, M., Streeter, M., Bouetel, L., Blasquez, J., Clasen, H., Semino, G., Dong, J., Scott, D., Pitts, B., Raibaut, C., Uming Ko,Year:
2005
Language:
english
DOI:
10.1109/dac.2005.193870
File:
PDF, 263 KB
english, 2005