[IEEE 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Singapore, Singapore (2015.6.1-2015.6.4)] 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Comparison of capacitive versus resistive mode of sensing for vapor phase explosive detection
Gilda, Neena A, Rao, V. RamgopalYear:
2015
DOI:
10.1109/edssc.2015.7285233
File:
PDF, 217 KB
2015