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[IEEE 2014 IEEE 60th Holm Conference on Electrical Contacts (Holm) - New Orleans, LA, USA (2014.10.12-2014.10.15)] 2014 IEEE 60th Holm Conference on Electrical Contacts (Holm) - An analysis of relationship between contact resistance and fracture of oxide film for connector contacts using finite element method
Kondo, Takaya, Nakata, Hirohito, Sekikawa, Junya, Kubota, Yoshihiro, Hayakawa, Kunio, Nakamura, TamotsuYear:
2014
Language:
english
DOI:
10.1109/holm.2014.7031025
File:
PDF, 957 KB
english, 2014