![](/img/cover-not-exists.png)
[IEEE 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Austin, TX, USA (2015.11.2-2015.11.6)] 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Statistical learning in chip (SLIC)
Blanton, Ronald D., Li, Xin, Mai, Ken, Marculescu, Diana, Marculescu, Radu, Paramesh, Jeyanandh, Schneider, Jeff, Thomas, Donald E.Year:
2015
Language:
english
DOI:
10.1109/iccad.2015.7372633
File:
PDF, 1.08 MB
english, 2015