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[IEEE 18th International Conference on Pattern Recognition (ICPR'06) - Hong Kong, China ()] 18th International Conference on Pattern Recognition (ICPR'06) - Efficient Cross-validation of the Complete Two Stages in KFD Classifier Formulation
Senjian An,, Wanquan Liu,, Venkatesh, S.Year:
2006
Language:
english
DOI:
10.1109/icpr.2006.473
File:
PDF, 151 KB
english, 2006