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[IEEE 18th International Conference on Pattern Recognition (ICPR'06) - Hong Kong, China ()] 18th International Conference on Pattern Recognition (ICPR'06) - Fast, Illumination Insensitive Face Detection Based on Multilinear Techniques and Curvature Features

Bauckhage, C., Kaster, T.
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Year:
2006
Language:
english
DOI:
10.1109/icpr.2006.551
File:
PDF, 369 KB
english, 2006
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