[IEEE 2009 IEEE International Geoscience and Remote Sensing...

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[IEEE 2009 IEEE International Geoscience and Remote Sensing Symposium - Cape Town, South Africa (2009.07.12-2009.07.17)] 2009 IEEE International Geoscience and Remote Sensing Symposium - Use of MODIS enhanced vegetation index to detect seasonal patterns of leaf phenology in central Amazon várzea forest

Hess, Laura, Ratana, Piyachat, Huete, Alfredo, Potter, Chris, Melack, John
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Year:
2009
Language:
english
DOI:
10.1109/igarss.2009.5417550
File:
PDF, 590 KB
english, 2009
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