[IEEE 2014 IEEE International Integrated Reliability...

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[IEEE 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) - South Lake Tahoe, CA, USA (2014.10.12-2014.10.16)] 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) - Dominant mechanisms of hot-carrier degradation in short- and long-channel transistors

Tyaginov, S., Bina, M., Franco, J., Wimmer, Y., Rudolf, F., Enichlmair, H., Park, J.-M., Kaczer, B., Ceric, H., Grasser, T.
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Year:
2014
Language:
english
DOI:
10.1109/iirw.2014.7049512
File:
PDF, 627 KB
english, 2014
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