![](/img/cover-not-exists.png)
[IEEE 2005 IEEE Instrumentationand Measurement Technology - Ottawa, ON, Canada (16-19 May 2005)] 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings - Automated Microwave Device Characterization Set-Up Based on a Technology-Independent Generalized Bias System
Traverso, P.A., Pirazzini, M., Santarelli, A., Filicori, F., Raffo, A.Volume:
1
Year:
2005
Language:
english
DOI:
10.1109/imtc.2005.1604157
File:
PDF, 703 KB
english, 2005