[IEEE 2000 International Symposium on Electromagnetic Compatibility (EMC 2000) - Washington, DC, USA (21-25 Aug. 2000)] IEEE International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.00CH37016) - Constructing the Lagrangian of VLSI devices from near field measurements of the electric and magnetic fields
Slattery, K.P., Muccioli, J.P., North, T.M.Volume:
1
Year:
2000
Language:
english
DOI:
10.1109/isemc.2000.875550
File:
PDF, 817 KB
english, 2000