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[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Estimation of current from near-field measurement
Haixiao Weng,, Beetner, D.G., DuBroff, R.E., Jin Shi,Volume:
1
Year:
2005
Language:
english
DOI:
10.1109/isemc.2005.1513504
File:
PDF, 752 KB
english, 2005