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[IEEE 2015 IEEE International Vacuum Electronics Conference (IVEC) - Beijing, China (2015.4.27-2015.4.29)] 2015 IEEE International Vacuum Electronics Conference (IVEC) - The reliability simulation of space TWT
Tian Hang,, Xu Hui,, Qi Weiling,, Liu Yiqun,, Huang, PengchaoYear:
2015
Language:
english
DOI:
10.1109/ivec.2015.7224017
File:
PDF, 280 KB
english, 2015