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[IEEE 2015 IEEE 23rd International Requirements Engineering Conference (RE) - Ottawa, ON, Canada (2015.8.24-2015.8.28)] 2015 IEEE 23rd International Requirements Engineering Conference (RE) - Inherent characteristics of traceability artifacts less is more
Hayes, Jane Huffman, Antoniol, Giulio, Adams, Bram, Gueheneuc, Yann-GaelYear:
2015
Language:
english
DOI:
10.1109/re.2015.7320422
File:
PDF, 713 KB
english, 2015