[IEEE 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Washington DC, USA (2015.9.9-2015.9.11)] 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Electrothermal simulation of ultra-scale MOSEFT
Nghiem, Thi Thu Trang, Saint-Martin, Jerome, Dollfus, PhilippeYear:
2015
Language:
english
DOI:
10.1109/sispad.2015.7292273
File:
PDF, 368 KB
english, 2015