[IEEE 2008 International SoC Design Conference (ISOCC) - Busan, Korea (South) (2008.11.24-2008.11.25)] 2008 International SoC Design Conference - Non-invasive direct probing for on-chip voltage measurement
Sato, Takashi, Yamanaga, Koh, Masu, KazuyaYear:
2008
Language:
english
DOI:
10.1109/socdc.2008.4815645
File:
PDF, 206 KB
english, 2008