[IEEE 2004 IEEE Region 10 Conference TENCON 2004. - Chiang Mai, Thailand (Nov. 21-24, 2004)] 2004 IEEE Region 10 Conference TENCON 2004. - TFT-LCD panel blob-mura inspection using the correlation of wavelet coefficients
Jae-Seung Ryu,, Jong-Hwan Oh,, Jeong-Goo Kim,, Tak-Mo Koo,, Kil-Houm Park,Volume:
A
Year:
2004
Language:
english
DOI:
10.1109/tencon.2004.1414396
File:
PDF, 1.85 MB
english, 2004