Consistency of ZT-Scanner for Thermoelectric Measurements...

Journal of Electronic Materials 2016 / 3 Vol. 45; Iss. 3

Consistency of ZT-Scanner for Thermoelectric Measurements from 300 K to 700 K: A Comparative Analysis Using Si80Ge20 Polycrystalline Alloys

Vasilevskiy, D., Simard, J.-M., Caillat, T., Masut, R. A., Turenne, S.
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Volume:
45
Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-015-4101-1
Date:
March, 2016
File:
PDF, 2.14 MB
english, 2016
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