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[IEEE 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Amherst, MA, USA (2015.10.12-2015.10.14)] 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - REPAIR: Hard-error recovery via re-execution
Soman, Jyothish, Miralaei, Negar, Mycroft, Alan, Jones, Timothy M.Year:
2015
Language:
english
DOI:
10.1109/DFT.2015.7315139
File:
PDF, 718 KB
english, 2015