[IEEE 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Wien, Vienna, Austria (2016.1.25-2016.1.27)] 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - RF SOI CMOS technology on 1st and 2nd generation trap-rich high resistivity SOI wafers
Esfeh, B. Kazemi, Kilchytska, V., Flandre, D., Raskin, J.-P.Year:
2016
Language:
english
DOI:
10.1109/ULIS.2016.7440077
File:
PDF, 804 KB
english, 2016