[IEEE 1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206) - Seattle, WA, USA (25-28 May 1998)] 1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206) - MCM structures with poled dielectrics to improve testability
Mechtel, D.M., Charles, H.K., Francomacaro, A.S.Year:
1998
Language:
english
DOI:
10.1109/ectc.1998.678907
File:
PDF, 623 KB
english, 1998