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[IEEE 2004 24th International Conference on Microelectronics - Nis, Serbia (16-19 May 2004)] 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716) - An analytical model to predict the short-circuit thermal failure in SOI LDMOS with Linear Doping Profile

Roig, J., Flores, D., Jorda, X., Urresti, J., Vellvehi, M., Rebollo, J., Milan, J.
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Volume:
1
Year:
2004
Language:
english
DOI:
10.1109/icmel.2004.1314573
File:
PDF, 256 KB
english, 2004
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