[IEEE Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference - Como, Italy (18-20 May 2004)] Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) - A CMOS compatible active thermopile with high frequency measurement
Chih-Hsiung Shen,, Wei-Feng Chen,, Shih-Han Yu,Year:
2004
Language:
english
DOI:
10.1109/imtc.2004.1351087
File:
PDF, 350 KB
english, 2004