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[IEEE 2007 IEEE International Symposium on Circuits and Systems - New Orleans, LA, USA (2007.05.27-2007.05.30)] 2007 IEEE International Symposium on Circuits and Systems - Automatic Detection of Solder Joint Defects on Integrated Circuits
Acciani, Giuseppe, Brunetti, Gioacchino, Fornarelli, GirolamoYear:
2007
Language:
english
DOI:
10.1109/iscas.2007.378143
File:
PDF, 302 KB
english, 2007