![](/img/cover-not-exists.png)
[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - A modified phase center and pattern matching method to reduce the geometry dependence of bilog calibration in standard site method
Hsing-Feng Chen,, Ken-Huang Lin,, Cheng-Chang Chen,, Yung-Chi Tang,Volume:
1
Year:
2005
Language:
english
DOI:
10.1109/isemc.2005.1513479
File:
PDF, 180 KB
english, 2005