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[IEEE 2014 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) - Naples, Italy (2014.11.3-2014.11.6)] 2014 IEEE International Symposium on Software Reliability Engineering Workshops - A Memory Model Based on Three-Valued Matrix for Static Defect Detection
Wang, Qian, Jin, Dahai, Gong, YunzhanYear:
2014
Language:
english
DOI:
10.1109/issrew.2014.75
File:
PDF, 602 KB
english, 2014