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[IEEE 2015 6th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI) - Gallipoli (2015.6.18-2015.6.19)] 2015 6th International Workshop on Advances in Sensors and Interfaces (IWASI) - Estimation of remaining life using embedded SRAM for wearout parameter extraction
Woongrae Kim,, Chang-Chih Chen,, Taizhi Liu,, Soonyoung Cha,, Milor, LindaYear:
2015
Language:
english
DOI:
10.1109/iwasi.2015.7184952
File:
PDF, 628 KB
english, 2015