[IEEE 2015 Annual Reliability and Maintainability Symposium (RAMS) - Palm Harbor, FL, USA (2015.1.26-2015.1.29)] 2015 Annual Reliability and Maintainability Symposium (RAMS) - A Bayesian approach for a complex system utilizing imperfect information
Yang, Lechang, Zhang, Jianguo, Wang, Pidong, Guo, YanlingYear:
2015
Language:
english
DOI:
10.1109/rams.2015.7105126
File:
PDF, 258 KB
english, 2015