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[IEEE 2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP) - Ann Arbor, MI, USA (2015.10.18-2015.10.21)] 2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Breakdown voltage prediction of SF6 gaps based on electric field features and SVM algorithm
Zhibin Qiu,, Jiangjun Ruan,, Daochun Huang,, Mengting Wei,, Congpeng Huang,, Shengwen Shu,Year:
2015
Language:
english
DOI:
10.1109/ceidp.2015.7351992
File:
PDF, 681 KB
english, 2015