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[IEEE 2015 73rd Annual Device Research Conference (DRC) - Columbus, OH, USA (2015.6.21-2015.6.24)] 2015 73rd Annual Device Research Conference (DRC) - III–V device integration on Si using template-assisted selective epitaxy
Schmid, Heinz, Borg, Mattias, Moselund, Kirsten, Gignac, Lynne, Breslin, Chris, Bruley, John, Cutaia, Davide, Riel, HeikeYear:
2015
Language:
english
DOI:
10.1109/drc.2015.7175666
File:
PDF, 838 KB
english, 2015