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[IEEE 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Enschede, The Netherlands (8-11 October 1996)] Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Introduction of plastic encapsulated devices in systems operating under severe temperature conditions
Hernandez, R., Le Peuch, O., Parmentier, B., Vial, R.Year:
1996
Language:
english
DOI:
10.1109/esref.1996.888251
File:
PDF, 338 KB
english, 1996