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[IEEE ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems - Malta (2-5 Sept. 2001)] ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.01EX483) - New test pattern generation units for NPSF oriented memory built-in self test
Chrisarithopoulos, A., Haniotakis, T., Tsiatouhas, Y., Arapoyanni, A.Volume:
2
Year:
2001
Language:
english
DOI:
10.1109/icecs.2001.957583
File:
PDF, 400 KB
english, 2001