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[IEEE International Conference on Microelectronics - Nis, Serbia (12-14 Sept. 1995)] Proceedings of International Conference on Microelectronics - The reliability of characteristics of the gas filled surge arresters under the influence of the radiation

Osmokrovic, P., Krivokapic, I., Kartalovic, N., Loncar, B.
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Volume:
1
Year:
1995
Language:
english
DOI:
10.1109/icmel.1995.500884
File:
PDF, 275 KB
english, 1995
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