[IEEE 2014 International Conference on Reliability, Maintainability and Safety (ICRMS) - Guangzhou, China (2014.8.6-2014.8.8)] 2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS) - Modeling of thermal behavior in the amorphous silicon thin film transistors
Liu, Yuan, En, Yunfei, He, Yujuan, Lei, ZhifengYear:
2014
Language:
english
DOI:
10.1109/icrms.2014.7107155
File:
PDF, 656 KB
english, 2014