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[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Design, modeling and characterization of embedded capacitor networks for mid-frequency decoupling in semiconductor systems
Muthana, P., Swaminathan, M., Tummala, R., Raj, P.M., Engin, E., Lixi Wan,, Balaraman, D., Bhattacharya, S.Volume:
2
Year:
2005
Language:
english
DOI:
10.1109/isemc.2005.1513592
File:
PDF, 250 KB
english, 2005